Библиографическая ссылка:
Чернышев К.Р. Application of Consistent Measures of Dependence within Fault Detection and Isolation Problems / Proceedings of the 12th IEEE Conference on Industrial Electronics and Applications (ICIEA 2017, Piscataway, USA). Piscataway, USA: IEEE, 2017. Т. 1. С. 1466-1470.